Jakub Kõo

Sirvi

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Modelling of Residual Stresses by Photoelastic Method during the Coating Deposition
(DGM Informationsgesellschaft, 1993) Kõo, Jakub; Lille, Harri; Valgur, Jaak; Idnurm, Siim; Estonian Agricultural University
A calculating scheme according to which the process of material growth is regarded as a continuous growth of the equidistant to interface elementray layers with initial stresses is widely used for determination of residual stresses in coatings (1)-(5). Since the experimental confirmation of reliability of this scheme is missing, an attempt to model the formation of stress state in the grown bar by photoelastic method has been undertaken by the authors. The research carried out confirms the validity of the scheme of continuous growth in layers and the well-known Saint-Venant´s principle.